The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2008
Filed:
Jul. 07, 2006
Minako Kaido, Tokyo, JP;
Kazuo Tsubota, Chiba-ken, JP;
Minako Kaido, Tokyo, JP;
Kazuo Tsubota, Chiba-ken, JP;
Other;
Qualitas Inc., Tokyo, JP;
Abstract
The present invention provides a method and apparatus for measuring operating vision. An optotype mark is displayed (step). A subject's response to the optotype mark is accepted via an input device (step). A determination is made as to whether or not the response is correct (step). When the current response of the subject is correct and the previous response or one of the previous response and the last-but-one response is incorrect, an optotype mark corresponding to the same visual acuity is presented (step). When the previous response is correct or both the previous response and the last-but-one response are correct, an optotype mark corresponding to a visual acuity one level higher is presented (step). When the current response is incorrect, an optotype mark corresponding to a visual acuity one level lower is presented (step).