The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2008
Filed:
Mar. 03, 2005
Applicants:
Seth S. Kessler, Brookline, MA (US);
Kristin A. Jugenheimer, Cambridge, MA (US);
Aaron B. Size, Cambridge, MA (US);
Christopher T. Dunn, Swampscott, MA (US);
Inventors:
Seth S. Kessler, Brookline, MA (US);
Kristin A. Jugenheimer, Cambridge, MA (US);
Aaron B. Size, Cambridge, MA (US);
Christopher T. Dunn, Swampscott, MA (US);
Assignee:
Metis Design Corporation, Cambridge, MA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 5/00 (2006.01); G01H 11/08 (2006.01);
U.S. Cl.
CPC ...
Abstract
A device for use in detecting structural damage includes at least one piezoelectric wafer that has a sensor, and an actuator in-plane with the sensor. At least one of the sensor and the actuator at least partially surrounds the other of the sensor and the actuator such that the piezoelectric wafer provides radial detection of structural occurrences in a material.