The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2008
Filed:
Nov. 13, 2006
Applicant:
Thomas J. Meyer, Marilla, NY (US);
Inventor:
Thomas J. Meyer, Marilla, NY (US);
Assignee:
Lockheed Martin Corporation, Bethesda, MD (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 7/14 (2006.01);
U.S. Cl.
CPC ...
Abstract
A system for measuring differential gravity at two points is disclosed. In the illustrative embodiment, the system uses a pair of graspers which each repeatedly grasp, raise, and drop a test mass. The accelerations of the two free-falling test masses are monitored using optical interferometry. An output signal is provided that is based on a differential acceleration of the two test masses.