The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2008

Filed:

Dec. 23, 2002
Applicants:

Dale J. Shidla, Roseville, CA (US);

Andrew H. Barr, Roseville, CA (US);

Jacky Tsun-yao Chang, Rocklin, CA (US);

Inventors:

Dale J. Shidla, Roseville, CA (US);

Andrew H. Barr, Roseville, CA (US);

Jacky Tsun-Yao Chang, Rocklin, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G06F 11/00 (2006.01); G06F 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for enabling multiple testing devices within a system. The method may include determining whether a first testing device or a second testing device is coupled to the system. Provided the first testing device is coupled to the system, the method may include enabling the first testing device to operate with an interface of the system capable of coupling to a device under test. Provided the second testing device is coupled to the system, the method may include enabling the second testing device to operate with the interface of the system.


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