The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2008
Filed:
Apr. 21, 2006
Philipp Bernhardt, Forchheim, DE;
Friedrich Koch, Pommersfelden, DE;
Martin Kolarjk, Nürnberg, DE;
Ernst Peter Rührnschopf, Erlangen, DE;
Helmuth Schramm, Neunkirchen, DE;
Philipp Bernhardt, Forchheim, DE;
Friedrich Koch, Pommersfelden, DE;
Martin Kolarjk, Nürnberg, DE;
Ernst Peter Rührnschopf, Erlangen, DE;
Helmuth Schramm, Neunkirchen, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
The invention relates to a method and an x-ray examination unit for analyzing and representing x-ray projection images with an x-ray examination unit, where the function relation b=ƒ(J/J) is established between the attenuation value and a material-equivalent value as a function of the energy spectrum used, and for the purposes of projection representation, the magnitude of the material-equivalent value bof a specific material is represented as an image value.