The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2008

Filed:

Jun. 05, 2003
Applicants:

Christoph Dietrich, Heidelberg, DE;

Christian Büchler, Villingen-Schwenningen, DE;

Inventors:

Christoph Dietrich, Heidelberg, DE;

Christian Büchler, Villingen-Schwenningen, DE;

Assignee:

Thomson Licensing, Boulogne-Billancourt, FR;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a method for optimized tracking of an optical scanner along a track of an optical recording medium, the track having information markings arranged in dense succession, and also having fundamental changes in properties in significantly lower density. The method has the following steps: formation of a track error signal, detection of the occurrence of fundamental changes in properties of the track, formation of an offset value from the comparison of the value of the track error signal that occurs shortly before and shortly after the fundamental change in properties, formation of the track error signal, taking account of the offset value and repetition of the aforementioned steps.


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