The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2008
Filed:
Dec. 05, 2003
Allen C. Thompson, Sunnyvale, CA (US);
George P. Tsai, San Jose, CA (US);
Russell Alan Parker, San Jose, CA (US);
Allen C. Thompson, Sunnyvale, CA (US);
George P. Tsai, San Jose, CA (US);
Russell Alan Parker, San Jose, CA (US);
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
Devices and methods for performing an array assay are provided. Embodiments of the subject array assay devices include (1) a base, (2) a cover, and (3) a clamping member for holding the cover to the base, wherein when the cover is operatively held to the base about a structure that includes an array assembly spaced-apart from a backing element, the array assembly and the backing element are deflected to substantially the same curvature. Embodiments of the subject methods include contacting a sample with a backing element and placing the backing element supported sample in contact with an array assembly to form a structure that includes the backing element and array assembly. The structure is then held together using a subject array assay device and the array substrate and the backing element are deflected to substantially the same curvature.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile