The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2008
Filed:
Apr. 27, 2006
Jan Van DE Kraats, Putten, NL;
Dirk Van Norren, Leusden, NL;
Tos T. J. M. Berendschot, Maastricht, NL;
Jan van de Kraats, Putten, NL;
Dirk van Norren, Leusden, NL;
Tos T. J. M. Berendschot, Maastricht, NL;
ZeaVision LLC, St. Louis, MO (US);
Abstract
A reflectometry instrument includes a light source, a spectrometer, and a first and second lens. The light source emits an illumination beam to the macula. The spectrometer measures a detection beam that is a portion of the illumination beam reflected from the eye and is indicative of the eye characteristics (e.g. macular pigment). The first and second lenses transmit the illumination beam to the macula and transmit the detection beam from the macula to the spectrometer. The instrument is used on an undilated pupil and minimizes unwanted reflections by at least one of the following: the first and second lenses include anti-reflection coatings; the illumination and detection beams pass through the first and second lenses at locations offset from their centers; and the illumination and the detection beams remain separated when passing through the first and second lenses. Zeaxanthin, lutein, and the total macular pigment levels are measured by the instrument.