The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2008

Filed:

Oct. 09, 2006
Applicants:

Ahmed Hammami, Edmonton, CA;

Terry Sopkow, Edmonton, CA;

Shawn David Taylor, Edmonton, CA;

Scott Jacobs, Edmonton, CA;

Hussein Alboudwarej, Edmonton, CA;

Inventors:

Ahmed Hammami, Edmonton, CA;

Terry Sopkow, Edmonton, CA;

Shawn David Taylor, Edmonton, CA;

Scott Jacobs, Edmonton, CA;

Hussein Alboudwarej, Edmonton, CA;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/16 (2006.01); G01N 35/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

Apparatus and methods are described for isolating or manipulating a portion of a sample at non-ambient temperatures and pressures. One apparatus embodiment of the invention comprises a primary sample containment vessel defining a primary chamber, the vessel having a primary sample inlet and outlet; a secondary sample collection container defining a collection chamber fluidly connected to the primary containment vessel; and a sample probe comprising a distal end able to isolate a secondary sample in the primary chamber and transfer it to the collection chamber, the probe fluidly connected to the primary chamber via a seal allowing at least the distal end to be moved in 3-dimensions within the primary chamber. This abstract complies with rules requiring an abstract. It should not be used to limit the scope or meaning of the claims. 37 CFR 1.72(b).


Find Patent Forward Citations

Loading…