The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2008
Filed:
Jun. 07, 2004
Jonathan M. Baccash, Sunnyvale, CA (US);
Igor Nazarenko, Sunnyvale, CA (US);
Uri Rodny, Mountain View, CA (US);
Ambuj Shatdal, Madison, WI (US);
Jonathan M. Baccash, Sunnyvale, CA (US);
Igor Nazarenko, Sunnyvale, CA (US);
Uri Rodny, Mountain View, CA (US);
Ambuj Shatdal, Madison, WI (US);
Hyperion Solutions Corporation, Santa Clara, CA (US);
Abstract
Selection of certain views of a multidimensional database to materialize may be accomplished using an efficient and effective solution. A set of all potential views may be stored in a structure. A path in the structure may then be traversed in an indicated direction through the structure, the path including two or more potential views and beginning at an indicated view. Then two or more immaterialized views in the path may be compared to each other to determine which immaterialized view is the optimum choice for maximizing benefit if selected to be materialized. Then the traversing and comparing may be continually iterated through, each iteration utilizing an indicated direction different than the last, each iteration also utilizing an indicated view set at the optimum choice determined by the last iteration, the iterating continuing until it converges on a single view. That single view may then be selected for materialization.