The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2008
Filed:
Mar. 11, 2004
Applicants:
Douglas M. Baney, Los Altos, CA (US);
Tun S. Tan, Redwood City, CA (US);
Bogdan Szafraniec, Sunnyvale, CA (US);
Inventors:
Douglas M. Baney, Los Altos, CA (US);
Tun S. Tan, Redwood City, CA (US);
Bogdan Szafraniec, Sunnyvale, CA (US);
Assignee:
Agilent Technologies, Inc., Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/06 (2006.01);
U.S. Cl.
CPC ...
Abstract
A system and method for superheterodyne detection in accordance with the invention. The system comprises a first conversion unit for performing a first heterodyne operation on an optical input signal to generate an electrical IF signal. A second conversion unit is electrically or optically coupled to the first conversion unit. The second conversion unit performs a second heterodyne operation to generate an electrical output signal suitable for signal processing.