The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2008

Filed:

Mar. 22, 2005
Applicants:

Shuang Luan, Albuquerque, NM (US);

Danny Z. Chen, Granger, IN (US);

Xiaobo S. HU, Granger, IN (US);

Chao Wang, Mishawaka, IN (US);

Xiaodong Wu, Iowa City, IA (US);

Cedric X. Yu, Clarksville, MD (US);

Inventors:

Shuang Luan, Albuquerque, NM (US);

Danny Z. Chen, Granger, IN (US);

Xiaobo S. Hu, Granger, IN (US);

Chao Wang, Mishawaka, IN (US);

Xiaodong Wu, Iowa City, IA (US);

Cedric X. Yu, Clarksville, MD (US);

Assignee:

University of Notre Dame du Lac, Notre Dame, IN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61N 5/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a method comprising the following steps: (a) partitioning an intensity modulated beam into a set of sub-IMBs; and (b) partitioning the sub-IMBs into segments, wherein steps (a) and (b) introduce no machine delivery error. The present invention also provides a method comprising the following steps: (a) recursively partitioning an intensity modulated beam into plateaus; and (b) partitioning the plateaus into segments, wherein step (a) comprises determining a tradeoff between machine delivery error and the number of segments into which the plateaus will be partitioned in step (b).


Find Patent Forward Citations

Loading…