The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7466457 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 16, 2008

Filed:

May. 01, 2006
Applicant:

Ku Ming Chen, Jhubei, TW;

Inventor:

Ku Ming Chen, Jhubei, TW;

Assignee:

Avision Inc., , TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/04 (2006.01); H04N 1/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

A sheet-fed scanner capable of scanning multiple scan lines for image signal calibration includes a housing, a sheet-feeding mechanism, a first scanning module, a first actuator and a first calibration sheet. The sheet-feeding mechanism disposed in the housing feeds a document across a scan region. The first scanning module rotatably mounted in the housing scans a front side of the document fed across the scan region. The first calibration sheet is fixed in the housing and disposed in the scan region. The first actuator drives the first scanning module to rotate such that the first scanning module senses a plurality of scan lines on the first calibration sheet to obtain a first calibration standard for calibrating a first image signal of the front side of the document. Thus, it is possible to avert any flaws in image quality caused by the contaminated calibration sheet.


Find Patent Forward Citations

Chen, Ku. (2008). Sheet-fed scanner capable of scanning multiple scan lines for image signal calibration (U.S. Patent No. 7466457). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7466457

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