The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2008
Filed:
Mar. 10, 2006
Applicants:
Chad A. Mirkin, Wilmette, IL (US);
Lidong Qin, Evanston, IL (US);
Can Xue, Evanston, IL (US);
Sungho Park, Evanston, IL (US);
Ling Huang, Evanston, IL (US);
Inventors:
Chad A. Mirkin, Wilmette, IL (US);
Lidong Qin, Evanston, IL (US);
Can Xue, Evanston, IL (US);
Sungho Park, Evanston, IL (US);
Ling Huang, Evanston, IL (US);
Assignee:
Northwestern University, Evanston, IL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention relates to methods of detecting analytes using nanowires having nanodisk arrays. In particular, the present invention discloses methods of detecting analytes via surface enhanced Raman scattering (SERS) and employing nanowires prepared using on-wire lithography (OWL).