The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2008
Filed:
Jun. 03, 2005
Applicants:
Dan Vacar, San Diego, CA (US);
David K. Mcelfresh, San Diego, CA (US);
Leoncio D. Lopez, Escondido, CA (US);
Robert Melanson, San Diego, CA (US);
Inventors:
Dan Vacar, San Diego, CA (US);
David K. McElfresh, San Diego, CA (US);
Leoncio D. Lopez, Escondido, CA (US);
Robert Melanson, San Diego, CA (US);
Assignee:
Sun Microsystems, Inc., Santa Clara, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for testing a substrate by using a photoemission microscope is provided which includes providing the substrate and applying a reverse bias voltage to the substrate. The method further includes detecting light emissions from a top surface of the substrate and characterizing viability of the substrate from the detection of the light emissions.