The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2008

Filed:

Jun. 02, 2005
Applicant:

Jae-hwan Yoo, Yongin-si, KR;

Inventor:

Jae-hwan Yoo, Yongin-si, KR;

Assignee:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 2/435 (2006.01); B41J 2/47 (2006.01);
U.S. Cl.
CPC ...
Abstract

A light scanning unit that corrects skew of a scanning line. The light scanning unit, which scans light on an exposed surface of a photosensitive medium, includes a light source to generate and illuminate at least one beam that corresponds to an image signal while being controlled on and off. A beam deflector deflects and scans a beam provided from the light source. A reflection mirror is obliquely arranged so that a scanning line directed to the exposed surface may be inclined with respect to a segment perpendicular to a transferring direction of the exposed surface to direct the scanning line to the exposed surface of the photosensitive medium by reflecting the scanning line provided from the beam deflector.


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