The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2008

Filed:

Jul. 12, 2007
Applicants:

Georgi I. Radulov, Eindhoven, NL;

Patrick J. Quinn, Chapelizod, IE;

Johannes A. Hegt, Rosmalen, NL;

Arthur H. M. Van Roermund, Helmond, NL;

Inventors:

Georgi I. Radulov, Eindhoven, NL;

Patrick J. Quinn, Chapelizod, IE;

Johannes A. Hegt, Rosmalen, NL;

Arthur H. M. van Roermund, Helmond, NL;

Assignee:

Xilinx, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for the calibration of current cells, whereby a current signal from each current cell may be generated by either a thermometer current cell, or a binary current cell. If generated by a binary current cell, then two or more replica binary current cells exist to form a group of binary current cells within two or more binary current cell sets. The current magnitude generated by each replica current cell of each binary current cell group is first calibrated to be substantially equal to each other. Next, the combined current generated by the replica current cell group is calibrated to be substantially equal to a magnitude of a temporary current signal, or a portion thereof. Subsequent less-significant binary current cell groups are similarly calibrated to the temporary current signal through the use of the previously calibrated, more-significant binary current cell groups.


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