The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2008
Filed:
Jul. 01, 2005
Igor Fridman, San Diego, CA (US);
Paul Hervieux, San Diego, CA (US);
Linas Kunstmanas, Valley Center, CA (US);
Robert Matthews, San Diego, CA (US);
Igor Fridman, San Diego, CA (US);
Paul Hervieux, San Diego, CA (US);
Linas Kunstmanas, Valley Center, CA (US);
Robert Matthews, San Diego, CA (US);
QUANTUM Applied Science & Research, Inc., San Diego, CA (US);
Abstract
The invention generally pertains to reducing artifact noise signals present when non-invasive capacitive-type signal measurements are taken of static electric fields produced by an object of interest. According to a first preferred embodiment of the invention, a given static artifact signal is reduced by minimizing the potential difference between a ground point of sensor circuitry and the potential of the object. According to a second preferred embodiment of the invention, the change in signal due to motion of the sensor in the field produced by the object is minimized by reducing the impact of changes in coupling to the signal source.