The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2008

Filed:

Nov. 10, 2006
Applicants:

Munther M. Hindi, Campbell, CA (US);

Lee M. Klynn, Los Altos, CA (US);

Inventors:

Munther M. Hindi, Campbell, CA (US);

Lee M. Klynn, Los Altos, CA (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 3/06 (2006.01); G01T 1/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A photon generating event capture system is configured to capture light photons. Image intensifiers are arranged to amplify light photons and sensors are arranged to capture the amplified light photons. A control system detects the amplification of light photons by the image intensifiers. Upon detecting amplification, the control system deactivates the image intensifiers to shutdown further light photon amplification and switches the sensors from a clear mode to an acquisition mode within a period of time less than a decay time of the image intensifiers. The locations and intensities of the amplified light photons are then captured and read out by the sensors. By operating the sensors in a clear mode prior to detecting amplification of light photons, noise recorded by the sensors prior to the detection of light photon amplification is either shifted out of the sensor prior to the photon generating event or is smeared across the sensor data. The effects of system noise can be reduced by detecting and removing this smeared sensor data.


Find Patent Forward Citations

Hindi, Munther. (2008). System and method for capturing scintillation events (U.S. Patent No. 7465938). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7465938

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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