The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2008
Filed:
Feb. 21, 2006
Mitsuaki Amemiya, Saitama, JP;
Mitsuaki Amemiya, Saitama, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A measuring method that utilizes a bandpass filter and a measurement apparatus to measure an intensity of light having a predetermined wavelength among lights emitted from a light source, the bandpass filter transmitting the light having the predetermined wavelength, the measurement apparatus measuring an absolute intensity of an incident light includes the steps of measuring an output of the measurement apparatus continuously, stopping or starting an emission of the light source in the measuring step, calculating a first extreme value t→t−0 and a second extreme value t→t+0 in the output of the measurement apparatus at time twhere t is time in the measuring step, and tis time when the emission of the light source stops; and calculating a difference between the first extreme value t→t−0 and the second extreme value t→t+0.