The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2008

Filed:

Mar. 22, 2006
Applicants:

Kiki H. Hosea, Amherst, MA (US);

Matthew L. Breuer, Hadley, MA (US);

Inventors:

Kiki H. Hosea, Amherst, MA (US);

Matthew L. Breuer, Hadley, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/244 (2006.01); H01J 49/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

An ion detection system includes a mass analyzer generating an ion beam along an ion beam longitudinal axis. A field generator generates a field for altering the direction of ions in the ion beam away from the ion beam longitudinal axis. A conversion dynode includes an ion collision region on a conversion dynode surface. A conversion dynode axis passes through the ion collision region perpendicular to the conversion dynode surface, the conversion dynode axis being offset from and not intersecting the ion beam longitudinal axis. An electron multiplier receives secondary charged particles from the conversion dynode generated in response to the ion collision with the conversion dynode surface.


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