The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2008
Filed:
Jan. 30, 2006
An-ru Andrew Cheng, Hsin-Chu, TW;
Chang-song Lin, Hsinchu, TW;
Tzu-chun Liu, Taipei, TW;
Huan-yung Tseng, Hsinchu, TW;
An-Ru Andrew Cheng, Hsin-Chu, TW;
Chang-Song Lin, Hsinchu, TW;
Tzu-Chun Liu, Taipei, TW;
Huan-Yung Tseng, Hsinchu, TW;
Faraday Technology Corp., Hsin-Chu, TW;
Abstract
An integrated circuit for locating failure process layers. The circuit has a substrate with a scan chain disposed therein, having scan cells connected to form a series chain. Each connection is formed according to a layout constraint of a minimum dimension provided by design rules for an assigned routing layer. Since the connection in the assigned routing layer is constrained to a minimum, the scan chain is vulnerable to variations in processes relevant to the assigned routing layer. The scan chain makes it easier to locate processes causing low yield rate of the scan chain.