The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2008
Filed:
Dec. 08, 2005
Parag Birmiwal, Austin, TX (US);
Sundeep Chadha, Austin, TX (US);
Tilman Gloekler, Gaertringen, DE;
Johannes Koesters, Weil im Schoenbuch, DE;
Parag Birmiwal, Austin, TX (US);
Sundeep Chadha, Austin, TX (US);
Tilman Gloekler, Gaertringen, DE;
Johannes Koesters, Weil im Schoenbuch, DE;
International Business Machines Corporation, Armonk, NY (US);
Abstract
An apparatus for performing temporal checking is disclosed. A signal logger for performing temporal checking includes a group of edge detection modules and a group of counting modules. During testing, the signal logger is coupled to a device under testing (DUT). Each of the edge detection modules is capable of maintaining edge information after a state transition on a signal within the DUT has been detected. Each of the counting modules is associated with one of the edge detection modules. Each of the countering modules is capable of maintaining a clock cycle count information associated with a detected edge. After the testing has been completed, temporal checking information on a signal within the DUT can be obtained by reconstructing the edge information and the associated clock cycle count information of the signal collected during the test.