The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7464297 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 09, 2008

Filed:

Jun. 23, 2005
Applicants:

Orville Jay Potter, Iv, Seattle, WA (US);

Michael Robinson, Bellevue, WA (US);

Inventors:

Orville Jay Potter, IV, Seattle, WA (US);

Michael Robinson, Bellevue, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The integrated test framework of the present invention includes a test framework runtime that executes test scripts and that also allows a script to identify a variation tool called a 'data provider' that is responsible for providing data to the test framework runtime and controlling the iteration of the runtime through the variations. The script also identifies the type of data set from which the data provider should obtain the data from which the variations are derived and the location of the data set. Multiple variation data providers may be used in conjunction with an adapter layer that coordinates the iteration of each variation data provider and creates an aggregated variation over multiple varying parameters of different scope.


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Potter, IV, Orville. (2008). System and method for testing software using data-driven test variations (U.S. Patent No. 7464297). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7464297

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