The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2008

Filed:

Apr. 03, 2006
Applicants:

Akira Ogawa, Kanagawa-ken, JP;

Yukihiro Ushiku, Kanagawa-ken, JP;

Tomomi Ino, Kanagawa-ken, JP;

Inventors:

Akira Ogawa, Kanagawa-ken, JP;

Yukihiro Ushiku, Kanagawa-ken, JP;

Tomomi Ino, Kanagawa-ken, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01); G05B 19/418 (2006.01);
U.S. Cl.
CPC ...
Abstract

A quality control system has: a QC value storage unit, a data acquisition device, a device internal information storage unit, a recipe storage unit, a QC value prediction unit, a wafer determination unit, a recipe selection unit, and a measurement device.


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