The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2008
Filed:
Apr. 21, 2004
Robert Riley, Escondido, CA (US);
Huey Trando, San Diego, CA (US);
Robert Riley, Escondido, CA (US);
Huey Trando, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
Methods and apparatus for detecting local maximums in a two-dimensional data set. Apparatus is provided for detecting a local maximum in a two-dimensional data set, where a stream of data elements represents the data set. The apparatus includes first detection logic that receives the data stream and operates to detect a first data element that represents a peak in a first dimension of the data set. The apparatus also includes second detection logic that receives the data stream and operates to detect a second data element that represents a peak in a second dimension of the data set, wherein a local maximum is detected if the first and second data elements are the same element.