The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2008

Filed:

Sep. 14, 2005
Applicants:

Fusayuki Takeshita, Seoul, KR;

Hiroyuki Kamiya, Seongnam-si, KR;

Kyeong-hyeon Kim, Yongin-si, KR;

Yong-hwan Shin, Yongin-si, KR;

Hak-sun Chang, Yongin-si, KR;

Inventors:

Fusayuki Takeshita, Seoul, KR;

Hiroyuki Kamiya, Seongnam-si, KR;

Kyeong-Hyeon Kim, Yongin-si, KR;

Yong-hwan Shin, Yongin-si, KR;

Hak-sun Chang, Yongin-si, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03B 17/48 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for measuring response time of a display apparatus including a photographing part including a charge coupled device camera and a microscope, an image processing part receiving a picture taken from a photographing part and calculating the response time thereof, and a control part applying a predetermined image signal to the display apparatus and controlling the photographing part to take a picture change of the display apparatus at a predetermined time.


Find Patent Forward Citations

Takeshita, Fusayuki. (2008). Apparatus for measuring response time and method of measuring of response time using the same (U.S. Patent No. 7463826). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7463826

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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