The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2008
Filed:
Sep. 29, 2006
Mitsuru Takai, Tokyo, JP;
Takahiro Suwa, Tokyo, JP;
Mitsuru Takai, Tokyo, JP;
Takahiro Suwa, Tokyo, JP;
TDK Corporation, Tokyo, JP;
Abstract
There are provided a next process-determining method capable of determining a next process to be carried out next objectively and at the same time in a short time period, as well as an inspecting method and apparatus which are capable of carrying out a predetermined inspection as to an object to be inspected according to the next process-determining method. A sample object is digitized to sample data formed by digital data. The sample data is compressed into compressed sample data according to a predetermined data format. There is calculated a difference data amount between a data amount of the compressed sample data and a data amount of reference data formed by digitizing and compressing a reference sample object in the same manner as the sample object is processed. Which of a plurality of predetermined numerical ranges the difference data amount belongs to is identified. A predetermined process is determined which is associated with the identified numerical range in advance as a next process to be carried out next.