The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2008
Filed:
May. 27, 2005
Ole Eichhorn, Westlake Village, CA (US);
Greg Crandall, Rancho Santa Fe, CA (US);
Steven Hashagen, Albuquerque, NM (US);
Dirk Soenksen, Carlsbad, CA (US);
Mark Wrenn, Oceanside, CA (US);
Ole Eichhorn, Westlake Village, CA (US);
Greg Crandall, Rancho Santa Fe, CA (US);
Steven Hashagen, Albuquerque, NM (US);
Dirk Soenksen, Carlsbad, CA (US);
Mark Wrenn, Oceanside, CA (US);
Aperio Technologies, Inc., Vista, CA (US);
Abstract
Systems and methods for creating and viewing three dimensional virtual slides are provided. One or more microscope slides are positioned in an image acquisition device that scans the specimens on the slides and makes two dimensional images at a medium or high resolution. This two dimensional images are provided to an image viewing workstation where they are viewed by an operator who pans and zooms the two dimensional image and selects an area of interest for scanning at multiple depth levels (Z-planes). The image acquisition device receives a set of parameters for the multiple depth level scan, including a location and a depth. The image acquisition device then scans the specimen at the location in a series of Z-plane images, where each Z-plane image corresponds to a depth level portion of the specimen within the depth parameter.