The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2008
Filed:
Jan. 26, 2006
Applicants:
Rafael Storz, Heidelberg, DE;
Heinrich Ulrich, Heidelberg, DE;
Inventors:
Rafael Storz, Heidelberg, DE;
Heinrich Ulrich, Heidelberg, DE;
Assignee:
Leica Microsystems CMS GmbH, Wetzlar, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/26 (2006.01);
U.S. Cl.
CPC ...
Abstract
A microscope includes an adjustment device for positioning a specimen stage. An objective, an objective changer and/or an objective turret is coupled to the adjustment device so that a position of the objective element is adjustable by the adjustment device. A holder for the objective element may be provided coupling the objective element to the adjustment device.
Storz, Rafael. (2008). Microscope (U.S. Patent No. 7463414). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7463414
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile