The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2008
Filed:
Apr. 13, 2005
Joseph M. Lasker, Brooklyn, NY (US);
Andreas Hielscher, Brooklyn, NY (US);
James M. Masciotti, Hartsdale, NY (US);
Christoph H. Schmitz, Brooklyn, NY (US);
Mathew Schoenecker, Berkeley, CA (US);
Joseph M. Lasker, Brooklyn, NY (US);
Andreas Hielscher, Brooklyn, NY (US);
James M. Masciotti, Hartsdale, NY (US);
Christoph H. Schmitz, Brooklyn, NY (US);
Mathew Schoenecker, Berkeley, CA (US);
The Trustees of Columbia University in the City of New York, New York, NY (US);
The Research Foundation of State University of New York, Albany, NY (US);
Abstract
The present invention provides systems, methods and apparatuses that perform digital detection for use in optical tomography. Methods and systems are provided in which digital lock-in detection is performed using an algorithm that employs a phase-independent quadrature technique. Methods and systems are provided in which a unique manipulation of an ordinary averaging filter optimized for sources discrimination and the consequent sampling constraints is presented as a novel filtering scheme for the lock-in detection. Systems and apparatuses are provided which include a digital signal processor which performs digital lock-in detection and an integrated complex programmable logic device for timing control. Apparatuses are provided which include an instrument having an integrated digital signal processor for performing digital processing and detection for use in optical tomography.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile