The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2008

Filed:

Dec. 16, 2004
Applicants:

Juerg Hinderling, Marbach, CH;

Paul Benz, Diepoldsau, CH;

Marcel Buerki, Au, CH;

Inventors:

Juerg Hinderling, Marbach, CH;

Paul Benz, Diepoldsau, CH;

Marcel Buerki, Au, CH;

Assignee:

Leica Geosystems AG, Heerbrugg, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A device for measuring the distances (d) to far-off objects () and close objects by emitting modulated laser beams () that are reflected on the objects. The device includes an objective (), structure(s) () for selecting beams, and a receiver (). Beams are bundled by the objective, the beams not only containing the laser beams () reflected on the objects but also background beams (). The beams in an associated cross-sectional region () of the bundle are selected from a bundle of beams by the selection structure(s) (). The cross-sectional region includes a first section () and at least one second section (), laser beams () reflected by a far-off object being associated with the first section (), and laser beams () reflected by a close object () being associated with the at least second section ().


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