The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2008
Filed:
Jun. 23, 2004
Applicants:
Ludwig Bär, Erlangen, DE;
Werner Heinrich, Bärenklau, DE;
Inventors:
Ludwig Bär, Erlangen, DE;
Werner Heinrich, Bärenklau, DE;
Assignee:
Siemens Aktiengesellschaft, Munich, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/26 (2006.01); G01N 27/72 (2006.01);
U.S. Cl.
CPC ...
Abstract
When using a rigid substrate eddy current probe to measure a non-planer test piece, the probe must be adapted to the test piece shape in order to avoid incorrect measurement values. Disclosed is a probe which is configured in a flexible manner via a flexible substrate so as to be adjustable to different radii of curvature of a test piece. Furthermore the probe lining is also embodied in an elastic manner.
Bär, Ludwig. (2008). Probe for electrical measurement methods, especially eddy current measurements (U.S. Patent No. 7463039). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7463039
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile