The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2008

Filed:

Sep. 26, 2006
Applicants:

Hsiao-tsu NI, Hsinchuang, TW;

Yaw-tzorng Tsorng, Kuei Shan Hsiang, TW;

Chung-ping Liu, Kuei Shan Hsiang, TW;

Chen-sheng Tang, Kuei Shan Hsiang, TW;

Inventors:

Hsiao-Tsu Ni, Hsinchuang, TW;

Yaw-Tzorng Tsorng, Kuei Shan Hsiang, TW;

Chung-Ping Liu, Kuei Shan Hsiang, TW;

Chen-Sheng Tang, Kuei Shan Hsiang, TW;

Assignee:

Quanta Computer Inc., Tao Yuan Shien, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A slant detection device is used for detecting whether the to-be-tested pin of a connector is slanted. The connector has a socket. The to-be-tested pin is disposed in the socket. The detection device includes a detector and a sensor. The detector includes a body, a first protrusion and a second protrusion. The first and second protrusions are protruded from one side of the body for being inserted into the socket. The first and second protrusions are spaced to define a gap. The width of the gap is greater than the width of the to-be-tested pin. If the pin is normal, the to-be-tested pin is inserted into the gap. If the to-be-tested pin is slanted, the to-be-tested pin touches the first or second protrusion to cause a short circuit. The sensor is electrically connected to the detector, for outputting a sensing signal when sensing the short circuit.


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