The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2008
Filed:
Dec. 20, 2004
Wei LI, Sichuan, CN;
Hongxia Wang, Sichuan, CN;
Rongliang Duan, Sichuan, CN;
Zhishang Bian, Sichuan, CN;
Yongchun Xiang, Sichuan, CN;
Meiying He, Sichuan, CN;
Jian Gong, Sichuan, CN;
Wei Li, Sichuan, CN;
Hongxia Wang, Sichuan, CN;
Rongliang Duan, Sichuan, CN;
Zhishang Bian, Sichuan, CN;
Yongchun Xiang, Sichuan, CN;
Meiying He, Sichuan, CN;
Jian Gong, Sichuan, CN;
Abstract
The present invention relates to the method and equipment for inspecting nuclear experimental locales, and particularly relates to the method and system for separating and measuringAr quickly. The method of the invention comprises the steps of sampling, eliminating impurities, separating, purifying, measuring the sum of Ar, collecting Ar, measuring the activity ofAr, etc. The control unit in the system of the invention connects respectively to a sampling unit, a separating-purifying unit, and a radioactivity measuring unit which are connected in turn, and a computer and the software of the control unit are in charge of the automatic operation, measurement and data-collection of the whole system. The method and system for quickly separating and measuringAr of the patent can meet the requirements of locales inspection for Comprehensive Test Ban Treaty (CTBT), the sensitivity of measuringAr is high, so do the production and purity of Ar. The system can also be operated on vehicle, which is flexible and has good work efficiency.