The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2008

Filed:

Apr. 26, 2004
Applicants:

Dennis Barket, Jr., Lafayette, IN (US);

J. Mitchell Wells, Lafayette, IN (US);

Inventors:

Dennis Barket, Jr., Lafayette, IN (US);

J. Mitchell Wells, Lafayette, IN (US);

Assignee:

Griffin Analytical Technologies, L.L.C., West Lafayette, IN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B01D 59/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

Analysis methods are provided that include generating a sample data set using a sample, the sample data set comprising first and second data sets, wherein each of the first and second data sets comprises at least one of an analytical parameter and a sample characteristic acquired using the analytical parameter; and using the first and the second data sets, identifying the sample. Instruments including an ionization source configured to apply different ionization energies to a sample to provide different sample characteristics, and processing circuitry configured to process the different sample characteristics to identify the sample are provided.


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