The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2008
Filed:
Jul. 13, 2006
Applicant:
Masato Yabe, Hachioji, JP;
Inventor:
Masato Yabe, Hachioji, JP;
Assignee:
Olympus Corporation, Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 21/26 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention provides a focus detection apparatus. In the focus detection apparatus, a luminous flux deformation member is provided to deform a sectional shape of a luminous flux emitted from a light source, and thereby a light quantity difference and a light intensity difference are decreased in light beams which are emitted to a sample surface and received by a photodetector even if objective lenses to be used are differ from each other in a pupil diameter. Consequently, the sample is irradiated with a single spot or multi spots to determine whether or not a focused state is obtained.