The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2008

Filed:

Jun. 23, 2005
Applicants:

Jae Chang Jung, Seoul, KR;

Cheol Kyu Bok, Icheon-shi, KR;

Chang Moon Lim, Icheon-shi, KR;

Seung Chan Moon, Yongin-si, KR;

Inventors:

Jae Chang Jung, Seoul, KR;

Cheol Kyu Bok, Icheon-shi, KR;

Chang Moon Lim, Icheon-shi, KR;

Seung Chan Moon, Yongin-si, KR;

Assignee:

Hynix Semiconductor Inc., Icheon-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/32 (2006.01); G03F 7/095 (2006.01); G03F 7/11 (2006.01); G03F 7/039 (2006.01); C08F 22/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed herein is a top anti-reflective coating polymer represented by Formula 1, below: wherein R1 and R2 are independently hydrogen, fluoro, methyl or fluoromethyl; R3 is a C1-10 hydrocarbon or a C1-10 hydrocarbon in which the hydrogen atoms are partly replaced by fluorine atoms; and a, b and c, representing the mole fraction of each monomer, are in the range between 0.05 and 0.9. Because a top anti-reflective coating formed using the anti-reflective coating polymer of Formula 1 is not soluble in water, it can be applied to immersion lithography using water as a medium for a light source. In addition, because the top anti-reflective coating can reduce the reflectance from an underlying layer, the uniformity of CD is improved, thus enabling the formation of an ultra fine pattern.


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