The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2008

Filed:

Feb. 09, 2007
Applicants:

Rudolf Mittmann, Tacherting, DE;

Erich Strasser, Trostberg, DE;

Inventors:

Rudolf Mittmann, Tacherting, DE;

Erich Strasser, Trostberg, DE;

Assignee:

Johannes Heidenhain, GmbH, Traunreut, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/244 (2006.01); G01D 5/347 (2006.01);
U.S. Cl.
CPC ...
Abstract

A position measuring arrangement that includes an arrangement of scanning elements for scanning an absolute code and a selection system for selecting scanning signals from the arrangement of scanning elements by a first method of selection and a second method of selection different from the first method of selection. The position measuring arrangement further includes a decoding device for forming a first absolute measured position value from the scanning signals selected by the selection system when the first method of selection is applied to the selection system and a second absolute measured position value from the scanning signals selected by the selection system when the second method of selection is applied.


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