The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2008
Filed:
Apr. 12, 2006
Wolfgang Madlener, Ravensburg, DE;
Wilfried Veil, Ravensburg, DE;
Wolfgang Madlener, Ravensburg, DE;
Wilfried Veil, Ravensburg, DE;
Other;
Abstract
A method for measuring workpieces with a measuring probe on a machine tool with linear axes of motion and at least one pivoting axis is provided, whereby the deviation of an actual position of a calibrating body in a pivoted position, in relation to a theoretical pivoted position which the calibrating body ideally occupy without a pivoting error, is used to determine a correction value. An actual measured value for calculating a coordinate of a measuring point on a measurement object or a theoretical measuring-point coordinate to be approached on the measurement object is corrected using the correction value when a measurement is carried out on the measurement object in a corresponding pivoted position. A device for implementing the method is also provided.