The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2008

Filed:

Sep. 30, 2005
Applicants:

Douglas J. Reichard, Fairview, OH (US);

Clifton H. Bromley, New Westminster, CA;

Eric G. Dorgelo, Port Moody, CA;

Kevin G. Gordon, Annacis Island Delta, CA;

Marc D. Semkow, Burnaby, CA;

Shafin A. Virji, Vancouver, CA;

Inventors:

Douglas J. Reichard, Fairview, OH (US);

Clifton H. Bromley, New Westminster, CA;

Eric G. Dorgelo, Port Moody, CA;

Kevin G. Gordon, Annacis Island Delta, CA;

Marc D. Semkow, Burnaby, CA;

Shafin A. Virji, Vancouver, CA;

Assignee:

Rockwell Automation Technologies, Inc., Mayfield Heights, OH (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 13/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods of industrial control processes that employ a data matching component associated with a programming logic controller (PLC), to substitute a plurality of collected data points with a data pattern (e.g., a curve). Such data matching component can facilitate data trending analysis, wherein a running industrial process can be compared with a predetermined criteria (industrial process with optimal/desired performance). A graphical tool (e.g., an on-screen) can be provided as part of the matching component, to enable a user to interactively set deviation thresholds from a predetermined criteria (e.g., optimum performance of an industrial operation.)


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