The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2008

Filed:

Oct. 07, 2005
Applicant:

Roy G. Batruni, Danville, CA (US);

Inventor:

Roy G. Batruni, Danville, CA (US);

Assignee:

Optichron, Inc., Fremont, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 13/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

An observation system configured to observe at least one known state variable of an observed system includes a plurality of filters that are configured to receive a system input, and generate the at least one unknown state variable. Generating the unknown state variable includes processing the system input, a plurality of known state variables, and a time varying mode vector. An inverse system configured to observe at least one inverse state variable of an original system includes a plurality of filters that are configured to receive a system input, and generate the at least one inverse state variable. Generating the inverse state variable includes processing the system input, a plurality of known state variables associated with the original system, and a time varying mode vector associated with the original system.


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