The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2008

Filed:

Mar. 09, 2007
Applicants:

Yoshikatsu Ichimura, Tokyo, JP;

Yasuhiro Shimada, Kanagawa-ken, JP;

Yasushi Mizoguchi, Miyagi-ken, JP;

Yoshitaka Zaitsu, Kanagawa-ken, JP;

Inventors:

Yoshikatsu Ichimura, Tokyo, JP;

Yasuhiro Shimada, Kanagawa-ken, JP;

Yasushi Mizoguchi, Miyagi-ken, JP;

Yoshitaka Zaitsu, Kanagawa-ken, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03G 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

To provide an electric potential measuring device which is useful in realizing size reduction, high sensitivity, and high reliability. The electric potential measuring device includes: an oscillating device which includes torsion springs, and an oscillating body axially supported by the springs to oscillate; and signal detecting unit which is located on a surface of the oscillating body. A capacitance between the detection electrode and a surface of an electric potential measuring object is varied by varying a distance therebetween by the oscillating device, whereby an output signal appearing on the detection electrode is detected.


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