The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2008

Filed:

Aug. 04, 2005
Applicants:

Chris Pal, Cambridge, CA;

Drew Steedly, Redmond, WA (US);

Richard Szeliski, Bellevue, WA (US);

Inventors:

Chris Pal, Cambridge, CA;

Drew Steedly, Redmond, WA (US);

Richard Szeliski, Bellevue, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/36 (2006.01); G06K 9/32 (2006.01);
U.S. Cl.
CPC ...
Abstract

A 'Keyframe Stitcher' provides an efficient technique for building mosaic panoramic images by registering or aligning video frames to construct a mosaic panoramic representation. Matching of image pairs is performed by extracting feature points from every image frame and matching those points between image pairs. Further, the Keyframe Stitcher preserves accuracy of image stitching when matching image pairs by utilizing ordering information inherent in the video. The cost of searching for matches between image frames is reduced by identifying 'keyframes' based on computed image-to-image overlap. Keyframes are then matched to all other keyframes, but intermediate image frames are only matched to temporally neighboring keyframes and neighboring intermediate frames to construct a “match structure.” Image orientations are then estimated from this match structure and used to construct the mosaic. Matches between image pairs may be compressed to reduce computational overhead by replacing groups of feature points with representative measurements.


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