The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2008

Filed:

Dec. 09, 2004
Applicants:

John H. Stanback, Ft Collins, CO (US);

Xuemei Zhang, Mountain View, CA (US);

Ramakrishna Kakarala, Santa Clara, CA (US);

Bond Yu Pong Ying, Corvallis, OR (US);

Inventors:

John H. Stanback, Ft Collins, CO (US);

Xuemei Zhang, Mountain View, CA (US);

Ramakrishna Kakarala, Santa Clara, CA (US);

Bond Yu Pong Ying, Corvallis, OR (US);

Assignee:

Aptina Imaging Corporation, Grand Cayman, KY;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A digital image sensor comprising an array of pixels and a processor is provided. The array of pixels comprises a current pixel in a first color plane that is configured to produce a current sensor value, a first plurality of pixels in the first color plane that is configured to produce a first plurality of sensor values, and a second plurality of pixels in the second color plane that is configured to produce a second plurality of sensor values. The processor is configured to generate a plurality of estimate values using the first plurality of sensor values and a plurality of intensity ratios associated with the second plurality of sensor values, and the processor is configured to determine whether the current pixel is defective using the plurality of estimate values and the current sensor value.


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