The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2008
Filed:
May. 13, 2004
Shingo Kawai, Funabashi, JP;
Hideo Kawada, Narashino, JP;
Naoto Yoshimoto, Chiba, JP;
Toru Ogawa, Chiba, JP;
Katsumi Iwatsuki, Yokohama, JP;
Shingo Kawai, Funabashi, JP;
Hideo Kawada, Narashino, JP;
Naoto Yoshimoto, Chiba, JP;
Toru Ogawa, Chiba, JP;
Katsumi Iwatsuki, Yokohama, JP;
Abstract
The present invention provides wavelength monitoring and/or control enabling size reduction and low power operation without requiring a complicated optical system in its wavelength monitoring and controlling mechanism. The measurement portion () measures temperature by a thermistor () in the measurement portion, and measures a bias current by using an LD drive current detecting circuit (). The LD temperature, optical output and bias current are measured by the measurement portion. The relationship between the LD temperature and wavelengths or between the temperature, bias current and wavelengths is stored in a memory map of the storage portion (). The central controlling portion () calculates wavelengths on the basis of the temperature and the bias current or the temperature information of the measurement portion, and the relationship between the LD temperature, bias current and wavelengths or between the temperature and wavelengths of the storage portion.