The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7460222 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 02, 2008

Filed:

Nov. 14, 2003
Applicants:

Stefan Kalveram, Viernheim, DE;

Friedrich Ziegler, Stuttgart, DE;

Hans-peter Haar, Wiesloch, DE;

Hans List, Hesseneck-Kailbach, DE;

Jean-michel Asfour, Offenbach, DE;

Inventors:

Stefan Kalveram, Viernheim, DE;

Friedrich Ziegler, Stuttgart, DE;

Hans-Peter Haar, Wiesloch, DE;

Hans List, Hesseneck-Kailbach, DE;

Jean-Michel Asfour, Offenbach, DE;

Assignee:

Roche Diagnostics Operations, Inc., Indianapolis, IN (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/10 (2006.01); G01N 21/47 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention concerns a measuring device for the optical analysis of a diagnostic test element () comprising a light source (), a photodetector () and a device () for positioning the test element () between the light source () and photodetector () where the light source () has one or several organic light-emitting diodes (OLEDs) and the OLEDs () for a composite structure with an imaging optics () and/or a photodetector () by means of a support substrate.


Find Patent Forward Citations

Quick Actions:

Kalveram, Stefan. (2008). Measuring device for the optical analysis of a test strip (U.S. Patent No. 7460222). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7460222

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…