The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2008
Filed:
Nov. 23, 2005
Jean-claude Lecomte, Saint Nizier du Moucherotte, FR;
Romain Fayolle, Grenoble, FR;
Jean-Claude Lecomte, Saint Nizier du Moucherotte, FR;
Romain Fayolle, Grenoble, FR;
INSIDIX, Seyssins, FR;
Abstract
The device enables strains of at least one surface () of a sample () to be measured versus temperature. Strains in a direction perpendicular to a predetermined plane, for example the plane of the surface (), are measured by composite images. Strains in said plane are measured by image correlation. The measurements by image correlation and by composite images use a common visible light detection camera (). The sample () is arranged in an enclosure () transparent at least locally to visible light (L). At least one infrared emitter () enables an infrared light to be created in a spectral band for a large part not detected by the camera ().