The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2008

Filed:

Jul. 06, 2001
Applicant:

Hartmut Ehbets, Berneck, CH;

Inventor:

Hartmut Ehbets, Berneck, CH;

Assignee:

Leica Geosystems A.G., Heerbrugg, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01); G01P 3/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a method for measuring a distance-related variable such as distance, speed or acceleration, or for levelling. An emitting device (-) comprising at least one microlaser () is used as an emitter, and the beam reflected off an object surface is received and evaluated for measurement. A beam is emitted and evaluated after being received, in a substantially simultaneous manner in at least two different wavelengths. Preferably, said method is carried out by means of a device whereby the microlaser () in the form of a passively pulsating microlaser () emits at least two different wavelengths. A receiver () for the laser beam reflected off an object is arranged downstream from the evaluating device ().


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