The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7460058 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 02, 2008

Filed:

Nov. 02, 2007
Applicant:

Motoi Nakanishi, Nagaokakyo, JP;

Inventor:

Motoi Nakanishi, Nagaokakyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/34 (2006.01); G01S 13/08 (2006.01); G01S 13/93 (2006.01); G01S 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A radar for detecting a target wherein a standard deviation of the amplitude of a beat signal from a transmission signal and a reception signal is determined for a predetermined period. A threshold is determined by adding a predetermined value to the standard deviation or by multiplying the standard deviation by a predetermined coefficient. The presence or absence of interference on the beat signal is detected according to the presence or the absence of an amplitude greater than the threshold. For example, an amplitude exceeding the standard deviation×2 is considered a spike noise (SPN), i.e., as 'presence of interference'. The threshold used for detecting peaks appearing on a frequency spectrum is then increased. This allows detection of the presence or the absence of a spike noise superposed on the beat signal to be performed more certainly, thereby enabling processing according to the presence or the absence of interference.


Find Patent Forward Citations

Nakanishi, Motoi. (2008). Radar (U.S. Patent No. 7460058). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7460058

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…